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Application of function-oriented roughness parameters using confocal microscopy
Klauer, K., Eifler, M., Seewig, J., Kirsch, B., Aurich, J.C.Language:
english
Journal:
Engineering Science and Technology, an International Journal
DOI:
10.1016/j.jestch.2018.04.004
Date:
April, 2018
File:
PDF, 2.50 MB
english, 2018