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[IEEE 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - San Antonio, TX, USA (2018.3.4-2018.3.8)] 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - A scalable drain current model of AlN/GaN MIS-HEMTs with embedded source field-plate structures
Aoki, H., Sakairi, H., Kuroda, N., Nakamura, Y., Chikamatsu, K., Nakahara, K.Year:
2018
Language:
english
DOI:
10.1109/APEC.2018.8341420
File:
PDF, 1.16 MB
english, 2018