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[IEEE 2018 IEEE 19th Latin-American Test Symposium (LATS) - Sao Paulo, Brazil (2018.3.12-2018.3.14)] 2018 IEEE 19th Latin-American Test Symposium (LATS) - A metric-guided gate-sizing methodology for aging guardband reduction
Gomez, Andres F., Gomez, Roberto, Champac, VictorYear:
2018
Language:
english
DOI:
10.1109/LATW.2018.8349677
File:
PDF, 901 KB
english, 2018