[IEEE 2018 IEEE 19th Latin-American Test Symposium (LATS) -...

  • Main
  • [IEEE 2018 IEEE 19th Latin-American...

[IEEE 2018 IEEE 19th Latin-American Test Symposium (LATS) - Sao Paulo, Brazil (2018.3.12-2018.3.14)] 2018 IEEE 19th Latin-American Test Symposium (LATS) - Exploiting power supply ramp rate for calibrating cell strength in SRAM PUFs

Wang, Wendong, Singh, Adit, Guin, Ujjwal, Chatterjee, Abhijit
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2018
Language:
english
DOI:
10.1109/LATW.2018.8349685
File:
PDF, 253 KB
english, 2018
Conversion to is in progress
Conversion to is failed