![](/img/cover-not-exists.png)
[IEEE 2018 IEEE 19th Latin-American Test Symposium (LATS) - Sao Paulo, Brazil (2018.3.12-2018.3.14)] 2018 IEEE 19th Latin-American Test Symposium (LATS) - Exploiting power supply ramp rate for calibrating cell strength in SRAM PUFs
Wang, Wendong, Singh, Adit, Guin, Ujjwal, Chatterjee, AbhijitYear:
2018
Language:
english
DOI:
10.1109/LATW.2018.8349685
File:
PDF, 253 KB
english, 2018