[IEEE 2018 Moscow Workshop on Electronic and Networking Technologies (MWENT) - Moscow, Russia (2018.3.14-2018.3.16)] 2018 Moscow Workshop on Electronic and Networking Technologies (MWENT) - Monte Carlo simulation of nuclear reaction induced soft error rate in modern commercial circuits
Galimov, Artur M., Alexandrov, Alexei V., Galimova, Regina M., Zebrev, Gennady I.Year:
2018
Language:
english
DOI:
10.1109/MWENT.2018.8337204
File:
PDF, 517 KB
english, 2018