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Development of a Wide-Spectral-Range High-Speed Spectrophotometer System for Measuring Hemispherical Reflectance and Normal Emittance of Surfaces Simultaneously(Thermal Engineering)
MAKINO, Toshiro, WAKABAYASHI, HidenobuVolume:
75
Year:
2009
DOI:
10.1299/kikaib.75.754_1329
File:
PDF, 843 KB
2009