Measurement of Complex Index of Refraction of Tungsten by Ellipsometry
Sato, Ayumu, Kashiwagi, Takahito, Sekine, Seishi, Ohkawa, MasashiVolume:
84
Year:
2000
DOI:
10.2150/jieij1980.84.appendix_39
File:
PDF, 4.50 MB
2000