[IEEE 2018 Design, Automation & Test in Europe...

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[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Exploiting on-chip power management for side-channel security

Singh, Arvind, Kar, Monodeep, Mathew, Sanu, Rajan, Anand, De, Vivek, Mukhopadhyay, Saibal
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Year:
2018
DOI:
10.23919/DATE.2018.8342043
File:
PDF, 624 KB
2018
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