[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Exploiting on-chip power management for side-channel security
Singh, Arvind, Kar, Monodeep, Mathew, Sanu, Rajan, Anand, De, Vivek, Mukhopadhyay, SaibalYear:
2018
DOI:
10.23919/DATE.2018.8342043
File:
PDF, 624 KB
2018