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[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Enhanced analog and RF IC sizing methodology using PCA and NSGA-II optimization kernel
Pessoa, Tiago, Lourenco, Nuno, Martins, Ricardo, Povoa, Ricardo, Horta, NunoYear:
2018
DOI:
10.23919/DATE.2018.8342092
File:
PDF, 341 KB
2018