[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - A peripheral circuit reuse structure integrated with a retimed data flow for low power RRAM crossbar-based CNN
Qiu, Keni, Chen, Weiwen, Xu, Yuanchao, Xia, Lixue, Wang, Yu, Shao, ZiliYear:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342168
File:
PDF, 917 KB
english, 2018