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Voltage Criterion for Electrostatic Detachment of a Microparticle from a Micromanipulated Probe
Saito, Shigeki, Himeno, Hideo, Takahashi, Kunio, Onzawa, TadaoVolume:
426-432
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.426-432.2345
Date:
August, 2003
File:
PDF, 370 KB
2003