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Observation of Real Metal Surfaces by Temperature Programmed Photoelectron Emission Technique. Temperature Dependence of the Amount of Emitted Electrons and Its Relationship to XPS Analysis.
KAMOSAWA, Tokirou, HONMA, Masakazu, MOMOSE, YoshihiroVolume:
51
Year:
2000
Language:
english
Journal:
Journal of the Surface Finishing Society of Japan
DOI:
10.4139/sfj.51.836
File:
PDF, 1.01 MB
english, 2000