Radiation-Hardened Flip-Flops with Low-Delay Overhead Using PMOS Pass-Transistors to Suppress SET Pulses in a 65 nm FDSOI Process
Yamada, Kodai, Maruoka, Haruki, Furuta, Jun, Kobayashi, KazutoshiYear:
2018
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2018.2826726
File:
PDF, 1.08 MB
english, 2018