Electronic Thin-Film Reliability || Terrace size...

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Electronic Thin-Film Reliability || Terrace size distribution in Si MBE

Tu, King-Ning
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Volume:
10.1017/CB
Year:
2010
Language:
english
DOI:
10.1017/CBO9780511777691.021
File:
PDF, 231 KB
english, 2010
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