![](/img/cover-not-exists.png)
[IEEE 2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Noida, India (2017.9.20-2017.9.22)] 2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Classic from the outside, smart from the inside: The era of smart buildings
Rafiq, Nafhath Rasheeda, Mohammed, Sadia Fatima, Pandey, Jitendra, Singh, Ajay VikramYear:
2017
Language:
english
DOI:
10.1109/ICRITO.2017.8342494
File:
PDF, 266 KB
english, 2017