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On the interplay between Si-Er-O segregation and erbium silicate (Er 2 Si 2 O 7 ) formation in Er-doped SiO x thin films
Beainy, G., Frilay, C., Pareige, P., Gourbilleau, F., Talbot, E.Volume:
755
Language:
english
Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2018.04.310
Date:
July, 2018
File:
PDF, 1.07 MB
english, 2018