[IEEE 2017 Conference on Information and Communication Technology (CICT) - Gwalior, India (2017.11.3-2017.11.5)] 2017 Conference on Information and Communication Technology (CICT) - Temperature sensitivity analysis on analog/RF and linearity metrics of electrically doped tunnel FET
Chandan, Bandi Venkata, Nigam, Kaushal, Pandey, Sunil, Sharma, Dheeraj, Kondekar, P NYear:
2017
Language:
english
DOI:
10.1109/INFOCOMTECH.2017.8340625
File:
PDF, 319 KB
english, 2017