[IEEE 2017 International Conference on Security, Pattern Analysis, and Cybernetics (SPAC) - Shenzhen (2017.12.15-2017.12.17)] 2017 International Conference on Security, Pattern Analysis, and Cybernetics (SPAC) - Graph embedding and its application in defect detection system
Huang, Qifeng, Zheng, Aixia, Shao, Xuesong, Lu, Xiaoquan, Duan, MeimeiYear:
2017
Language:
english
DOI:
10.1109/spac.2017.8304363
File:
PDF, 333 KB
english, 2017