Identification of whisker grain in Sn coatings by analyzing...

Acta Materialia 2017 / 08 Vol. 134

Identification of whisker grain in Sn coatings by analyzing crystallographic micro-texture using electron back-scatter diffraction

Jagtap, Piyush, Chakraborty, Aritra, Eisenlohr, Philip, Kumar, Praveen
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Volume:
134
Language:
english
Journal:
Acta Materialia
DOI:
10.1016/j.actamat.2017.05.063
Date:
August, 2017
File:
PDF, 6.55 MB
english, 2017
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