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Microelectronic Engineering 2018 / 4

Junction properties analysis of silicon back-to-back Schottky diode with reduced graphene oxide Schottky electrodes

Azmi, Siti Nadiah Che, Rahman, Shaharin Fadzli Abd, Nawabjan, Amirjan, Hashim, Abdul Manaf
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Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2018.04.020
Date:
April, 2018
File:
PDF, 977 KB
english, 2018
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