[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Fault isolation of digital scan logic without ‘scan diagnosis’
Yeoh, B. L., Goh, S. H., You, G. F., Hao, Hu, Tan, Alan, Chan, Y. H., Lin, Zhao, Lam, JeffreyYear:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060124
File:
PDF, 908 KB
english, 2017