[IEEE 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017 - Honololu, HI, USA (2017.6.4-2017.6.9)] 2017 IEEE MTT-S International Microwave Symposium (IMS) - A high-speed THz permittivity measurement system featuring a simple 2-tone generation method using LO leakage
Jyo, Teruo, Hamada, Hiroshi, Kitayama, Daisuke, Yaita, Makoto, Moutaouakil, Amine El, Matsuzaki, Hideaki, Nosaka, HideyukiYear:
2017
Language:
english
DOI:
10.1109/MWSYM.2017.8058918
File:
PDF, 526 KB
english, 2017