Electron Trapping in Extended Defects in Microwave AlGaN/GaN HEMTs With Carbon-Doped Buffers
Bergsten, Johan, Thorsell, Mattias, Adolph, David, Chen, Jr-Tai, Kordina, Olof, Sveinbjornsson, Einar O., Rorsman, NiklasYear:
2018
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2828410
File:
PDF, 2.50 MB
english, 2018