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[IEEE 2016 20th International Symposium on VLSI Design and Test (VDAT) - Guwahati, India (2016.5.24-2016.5.27)] 2016 20th International Symposium on VLSI Design and Test (VDAT) - On determination of instantaneous peak and cycle peak switching using ILP
Gulve, Rohini, Hage, Nihar, Tudu, JaynarayanYear:
2016
Language:
english
DOI:
10.1109/isvdat.2016.8064881
File:
PDF, 1.33 MB
english, 2016