[IEEE 2017 21st European Microelectronics and Packaging...

  • Main
  • [IEEE 2017 21st European...

[IEEE 2017 21st European Microelectronics and Packaging Conference (EMPC) & Exhibition - Warsaw, Poland (2017.9.10-2017.9.13)] 2017 21st European Microelectronics and Packaging Conference (EMPC) & Exhibition - Investigation of the influence of voids on the reliability of LED solder joints by computer tomography and forward voltage measurements

Schwarzer, Christian, Lang, Kurt-Jurgen, Fuchs, Dennis, Rauer, Miriam, Kaloudis, Michael, Krugelstein, Andreas, Franke, Jorg
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
Language:
english
DOI:
10.23919/EMPC.2017.8346840
File:
PDF, 791 KB
english, 2017
Conversion to is in progress
Conversion to is failed