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[IEEE 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Tucson, AZ, USA (2017.9.10-2017.9.14)] 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Chip-Level ESD-induced noise on internally and externally regulated power supplies
Xiu, Yang, Thomson, Nicholas, Mertens, Robert, Reiman, Collin, Rosenbaum, ElyseYear:
2017
Language:
english
DOI:
10.23919/EOSESD.2017.8073450
File:
PDF, 833 KB
english, 2017