[IEEE 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Tucson, AZ, USA (2017.9.10-2017.9.14)] 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Correlation study of different CDM testers and CC-TLP
Weber, Johannes, Kaschani, Karim T., Gieser, Horst, Wolf, Heinrich, Maurer, Linus, Famulok, Nicolai, Moser, Reinhard, Rajagopal, Krishna, Sellmayer, Michael, Sharma, Anmol, Tamm, HeikoYear:
2017
Language:
english
DOI:
10.23919/eosesd.2017.8073446
File:
PDF, 938 KB
english, 2017