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Goodness-of-Fit Test Based on Biinomial Probability Distribution
Kuleshov, E. L., Petrov, K. A., Kirillova, T. S., Khaliullin, R. A.Volume:
54
Language:
english
Journal:
Optoelectronics, Instrumentation and Data Processing
DOI:
10.3103/S8756699018010144
Date:
January, 2018
File:
PDF, 176 KB
english, 2018