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Analog Circuit Specification Testing by Means of Walsh–Hadamard Transform and Multiple Regression Supported by Evolutionary Computations
Golonek, Tomasz, Machniewski, JanLanguage:
english
Journal:
Circuits, Systems, and Signal Processing
DOI:
10.1007/s00034-017-0708-1
Date:
November, 2017
File:
PDF, 1.60 MB
english, 2017