![](/img/cover-not-exists.png)
Interface states in MOSFETs due to hot-electron injection determined by the charge pumping technique
Schmitt, D., Dorda, G.Volume:
17
Year:
1981
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19810535
File:
PDF, 469 KB
english, 1981