Interface states in MOSFETs due to hot-electron injection...

Interface states in MOSFETs due to hot-electron injection determined by the charge pumping technique

Schmitt, D., Dorda, G.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
17
Year:
1981
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19810535
File:
PDF, 469 KB
english, 1981
Conversion to is in progress
Conversion to is failed