Effect of deep traps on sheet charge in AlGaN/GaN high electron mobility transistors
Klein, P.B., Binari, S.C., Ikossi, K., Wickenden, A.E., Koleske, D.D., Henry, R.L.Volume:
37
Year:
2001
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:20011040
File:
PDF, 305 KB
english, 2001