[IEEE 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - San Antonio, TX, USA (2018.3.4-2018.3.8)] 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - TCAD modeling of a lateral GaN HEMT using empirical data
Hontz, Michael R., Chu, Rongming, Khanna, RaghavYear:
2018
Language:
english
DOI:
10.1109/APEC.2018.8341017
File:
PDF, 878 KB
english, 2018