[IEEE IECON 2017 - 43rd Annual Conference of the IEEE...

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[IEEE IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Beijing (2017.10.29-2017.11.1)] IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Statistical detection and isolation of cyber-physical attacks on SCADA systems

Do, Van Long
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Year:
2017
Language:
english
DOI:
10.1109/IECON.2017.8216596
File:
PDF, 2.80 MB
english, 2017
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