[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Dynamic current monitoring and probe laser simulation strategy to analyse complicated functional failure on mixed signal integrated circuit
Wen, Gaojie, Li, Xiaocui, Tian, Li, Ren, JunYear:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060073
File:
PDF, 1.19 MB
english, 2017