[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Bias- and temperature-assisted trapping/de-trapping of ron degradation in D-mode AlGaN/GaN MIS-HEMTs on a Si substrate
Zhang, Jin-Ming, Hsieh, Ting-En, Wu, Tian-Li, Chen, Szu-Hao, Chen, Shi-Xuan, Chou, Po-Chien, Chang, Edward YiYear:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060181
File:
PDF, 315 KB
english, 2017