On Trace Buffer Reuse based Trigger Generation in Post...

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2017

On Trace Buffer Reuse based Trigger Generation in Post Silicon Debug

Cheng, Yun, Li, Huawei, Wang, Ying, Shen, Haihua, Liu, Bo, Li, Xiaowei
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2017.2778084
File:
PDF, 1.06 MB
english, 2017
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