[IEEE 2016 74th Annual Device Research Conference (DRC) -...

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[IEEE 2016 74th Annual Device Research Conference (DRC) - Newark, DE, USA (2016.6.19-2016.6.22)] 2016 74th Annual Device Research Conference (DRC) - Plasmonic 1×200 array scanner based on 65-nm CMOS asymmetric FETs for real-time terahertz

Ryu, Min Woo, Ahn, Sang Hyo, Yang, Jong-Ryul, Lee, Woo-Jae, Han, Seong-Tae, Kim, Kyung Rok
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Year:
2016
DOI:
10.1109/drc.2016.7548490
File:
PDF, 674 KB
2016
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