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[IEEE 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2016.5.31-2016.6.3)] 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - The Study on Parameters Affecting Depth-Wise Photo-Curing Process Based on Interaction Between Light and Metal Surface
Jeong, Giho, Lee, Choonhee, Kang, Jinil, Lee, Okseon, Shin, AnseobYear:
2016
Language:
english
DOI:
10.1109/ectc.2016.33
File:
PDF, 832 KB
english, 2016