[IEEE 1985 IEEE International Symposium on Electromagnetic Compatibility - Wakefield, Massachusetts (1985.8.20-1985.8.22)] 1985 IEEE International Symposium on Electromagnetic Compatibility - Impulsive Noise Reduction in Data Communication Systems Employing Smear/Desmear Technique
Al-Araji, Saleh R., Allios, Janan E., Al-Mahdawi, Tareef I., Muhammad Ali, Ahmed S.Year:
1985
Language:
english
DOI:
10.1109/isemc.1985.7566981
File:
PDF, 489 KB
english, 1985