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[IEEE 2017 Prognostics and System Health Management Conference (PHM-Harbin) - Harbin, China (2017.7.9-2017.7.12)] 2017 Prognostics and System Health Management Conference (PHM-Harbin) - Analysis of time domain reflectometry for crack intermittency detection in circuit board
Huakang, Li, Kehong, Lv, Qiu, Jing, Liu, GuanjunYear:
2017
Language:
english
DOI:
10.1109/phm.2017.8079172
File:
PDF, 349 KB
english, 2017