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[IEEE 2016 Progress in Electromagnetic Research Symposium (PIERS) - Shanghai, China (2016.8.8-2016.8.11)] 2016 Progress in Electromagnetic Research Symposium (PIERS) - Design of life test method for chip-type metal inductor
Soon-Mi Hwang,, Chul-Hee Kim,, Kwan-Hun Lee,Year:
2016
Language:
english
DOI:
10.1109/piers.2016.7735625
File:
PDF, 73 KB
english, 2016