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[IEEE CAS 2001 International Semiconductor Conference - Sinaia, Romania (9-13 Oct. 2001)] 2001 International Semiconductor Conference. CAS 2001 Proceedings (Cat. No.01TH8547) - Determination of scanning parameters in intermittent contact operation mode AFM
Oprea, I., Gavrila, R., Dinescu, A., Oprica, R.Volume:
1
Year:
2001
Language:
english
DOI:
10.1109/smicnd.2001.967418
File:
PDF, 299 KB
english, 2001