Design and Implementation of a Test Circuit of a Repetitive...

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IEEE Transactions on Plasma Science 2017

Design and Implementation of a Test Circuit of a Repetitive Critical Rate of Rise of ON-State Current for a High-Power Thyristor

Lee, Byungha, Bae, Youngseok, An, Sanghyuk, Kim, Seong-Ho, Lee, Young-Hyun, Yang, Kyung-Seung, Koo, In-Su, Baek, Yong-Gi, Han, Gyu-Jin, Kim, Young-Bae
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Plasma Science
DOI:
10.1109/tps.2017.2771813
File:
PDF, 2.11 MB
english, 2017
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