On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST
TOMITA, Akihiro, WEN, Xiaoqing, SATO, Yasuo, KAJIHARA, Seiji, MIYASE, Kohei, HOLST, Stefan, GIRARD, Patrick, TEHRANIPOOR, Mohammad, WANG, Laung-TerngVolume:
E97.D
Year:
2014
Language:
english
Journal:
IEICE Transactions on Information and Systems
DOI:
10.1587/transinf.2014edp7039
File:
PDF, 3.48 MB
english, 2014