[IEEE 2017 Symposium on VLSI Technology - Kyoto (2017.6.5-2017.6.8)] 2017 Symposium on VLSI Technology - Flash Reliability Boost Huffman coding (FRBH): Co-optimization of data compression and Vth distribution modulation to enhance data-retention time by over 2900x
Deguchi, Yoshiaki, Kobayashi, Atsuro, Watanabe, Hikaru, Takeuchi, KenYear:
2017
Language:
english
DOI:
10.23919/VLSIT.2017.7998173
File:
PDF, 413 KB
english, 2017