[IEEE 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2017.5.30-2017.6.2)] 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) - Eye-Diagram Estimation Methods for Voltage-and Probability-Dependent PAM-4 Signal on Stacked Through-Silicon Vias (TSVs)
Park, Junyong, Kim, Jonghoon J., Choi, Sumin, Kim, Youngwoo, Kim, Heegon, Kim, JounghoYear:
2017
Language:
english
DOI:
10.1109/ECTC.2017.11
File:
PDF, 5.07 MB
english, 2017