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[IEEE 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2017.5.30-2017.6.2)] 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) - Use Condition Risk Assessment for Moisture Related Failures
Pei, Min, Mukherjee, Sibasish, Uppal, Nitin, Vujosevic, MilenaYear:
2017
Language:
english
DOI:
10.1109/ECTC.2017.162
File:
PDF, 670 KB
english, 2017