[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Heterogeneous stacking silicon controlled rectifier design with improved ESD performance
Dong, Aihua, He, Linfeng, Liang, Wei, Salcedo, Javier A., Hajjar, Jean-Jacques, Liou, Juin J., Sundaram, Kalpathy B.Year:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060176
File:
PDF, 304 KB
english, 2017