![](/img/cover-not-exists.png)
[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Pulsed-laser testing for single event effects in a stand-alone resistive random access memory
Kai, Xi, Feng, Zhang, Jin, Li, Lanlong, Ji, Cong, Fang, Jing, Liu, Ming, Liu, Jinshun, BiYear:
2017
Language:
english
DOI:
10.1109/IPFA.2017.8060178
File:
PDF, 360 KB
english, 2017