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[IEEE 2017 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Giardini Naxos - Taormina, Italy (2017.6.12-2017.6.15)] 2017 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Total ionizing dose effects on CMOS devices in a 110 nm technology
Riceputi, Elisa, Gaioni, Luigi, Manghisoni, Massimo, Re, Valerio, Dinapoli, Roberto, Mozzanica, AldoYear:
2017
Language:
english
DOI:
10.1109/PRIME.2017.7974152
File:
PDF, 1.71 MB
english, 2017