[IEEE 2017 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Giardini Naxos - Taormina, Italy (2017.6.12-2017.6.15)] 2017 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Total ionizing dose effects on CMOS devices in a 110 nm technology

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